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217. 
Cover image for Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
Author 
Wu, Bin, author.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780124077119
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218. 
Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author 
Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)
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ONLINE(331478.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4337-7
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219. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
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ONLINE(332682.1)
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http://dx.doi.org/10.1007/978-3-319-00122-7
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220. 
Cover image for Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
Author 
Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.
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ONLINE(334958.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-40511-2
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221. 
Cover image for Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
Author 
Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)
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ONLINE(335005.1)
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http://dx.doi.org/10.1007/978-3-642-40793-2
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222. 
Cover image for Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Author 
Epperlein, Peter W.
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ONLINE
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882
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223. 
Cover image for Rail human factors supporting reliability, safety and cost reduction
Rail human factors supporting reliability, safety and cost reduction
Author 
Dadashi, Nastaran. Scott, Anita. Wilson, John R. Mills, Ann.
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Distributed by publisher. Purchase or institutional license may be required for access.
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224. 
Cover image for Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
Author 
Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.
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ONLINE(365001.1)
Electronic Access 
Abstract with links to resource http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863
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225. 
Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
Author 
Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-29222-4
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226. 
Cover image for Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
Author 
Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.
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http://dx.doi.org/10.1007/978-3-642-32498-7
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227. 
Cover image for Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
Author 
Breysse, Denys. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-2736-6
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228. 
Cover image for Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
Author 
Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0947-2
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