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97. 
Cover image for Risk and reliability in geotechnical engineering
Risk and reliability in geotechnical engineering
Author 
Ching, Jianye, editor. Phoon, Kok-Kwang, editor.
Preferred Shelf Number 
TA706 .R48 2015
Electronic Access 
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98. 
Cover image for Reliability of large and complex systems
Reliability of large and complex systems
Author 
Kołowrocki, Krzysztof, author.
Preferred Shelf Number 
ONLINE(355886.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080999494
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99. 
Cover image for Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Author 
Birolini, Alessandro. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-39535-2
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100. 
Cover image for Ternary Networks Reliability and Monte Carlo
Ternary Networks Reliability and Monte Carlo
Author 
Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06440-6
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101. 
Cover image for Electricity infrastructure reliability and vulnerabilities
Electricity infrastructure reliability and vulnerabilities
Author 
Guerritore, Walter B.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180
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102. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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103. 
Cover image for Reliability models for engineers and scientists
Reliability models for engineers and scientists
Author 
Kaminskiy, Mark, 1946, author.
Preferred Shelf Number 
TA169 .K36 2013
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104. 
Cover image for Computer system reliability : safety and usability
Computer system reliability : safety and usability
Author 
Dhillon, B. S., author.
Preferred Shelf Number 
QA76.76 .R44 D495 2013
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105. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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106. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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ONLINE
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107. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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108. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0463-7
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