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Author

European Materials Research Society.

(3)

IUMRS International Conference on Advanced Materials (3rd : 1993 : Tokyo, Japan)

(2)

Materials Research Society.

(2)

Siffert, P. (Paul)

(2)

(2)

Aksay, Ilhan A.

(1)

(1)

Branz, Howard M., ed.

(1)

(1)

(1)

Dal Negro, Luca.

(1)

Dresselhaus, M. S., ed. by

(1)

European Materials Research Society. Meeting (1988 : Strasbourg, France)

(1)

Fogarassy, E. (Eric)

(1)

Geohegan, David B.

(1)

Grasman, Scott E. (Scott Erwin)

(1)

Habermeier, H.-U.

(1)

Haller, E. E., ed.

(1)

Hemment, P. L. F. (Peter L. F.)

(1)

Higinbotham, W. A., ed.

(1)

International Conference on Laser Ablation (3rd : 1996 : Strasbourg, France)

(1)

International Symposium on Silicon Molecular Beam Epitaxy (3rd : 1989 : Strasbourg, France)

(1)

International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France)

(1)

Kaldis, Emanuel.

(1)

(1)

(1)

Kaufmann, E. N., ed.

(1)

Kraner, H. W., ed.

(1)

(1)

Materials Research Society Annual Meeting (1881: Boston, Mass.)

(1)

Materials Research Society Symposium (1999 : San Francisco, Calif.)

(1)

Materials Research Society. Spring Meeting (2009 : San Francisco, Calif.). Symposium EE.

(1)

Materials for Nanophotonics--Plasmonics, Metamaterials and Light Localization (2009 : San Francisco, Calif.)

(1)

Matzke, Hj., 1936-

(1)

Mazzoldi, Paolo.

(1)

(1)

(1)

Parker, E. H. C.

(1)

(1)

Rooij, N. F. de.

(1)

(1)

(1)

Shenoy, G. K., ed.

(1)

(1)

Stuke, M. (Michael)

(1)

Symposium A on High Tc Superconductor Materials (1990 : Strasbourg, France)

(1)

Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France)

(1)

Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France)

(1)

Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France)

(1)

Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)

(1)

Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France)

(1)

Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)

(1)

Symposium F on Chemical and Physical Modifications Induced by Irradiation in Glasses (1991 : Strasbourg, France)

(1)

Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)

(1)

Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France)

(1)

Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France)

(1)

Ulrich, Donald R.

(1)

(1)

(1)

Woollam, John A.

(1)

Language

(24)

Publication Date

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Subject

(3)

Materials -- Congresses.

(3)

Semiconductors -- Congresses.

(3)

Silicon crystals -- Congresses.

(3)

Cadmium alloys.

(2)

Compound semiconductors -- Congresses.

(2)

Electronics -- Materials.

(2)

Ion implantation -- Congresses.

(2)

(2)

Lasers -- Industrial applications -- Congresses.

(2)

Materials -- Effect of radiation on -- Congresses.

(2)

Microstructure -- Congresses.

(2)

Molecular beam epitaxy -- Congresses.

(2)

Semiconductors -- Defects -- Congresses.

(2)

Amorphous semiconductors -- Congresses.

(1)

Ceramics -- Congresses.

(1)

Coating processes.

(1)

Complex ions -- Congresses.

(1)

Compound semiconductors -- Industrial applications -- Congresses.

(1)

Compound semiconductors.

(1)

(1)

Crystal growth -- Congresses.

(1)

ELEKTRON PARAMANYETİK REZONANS SPEKTROSKOPİSİ -- KONGRELER.

(1)

Electron beams -- Industrial applications -- Congresses.

(1)

Electronic books.

(1)

(1)

GRAFİT -- KONGRELER.

(1)

Glass -- Effect of radiation on -- Congresses.

(1)

(1)

(1)

High-temperature superconductors -- Congresses.

(1)

Hybrid electric cars.

(1)

Hydrogen as fuel.

(1)

Industrial applications.

(1)

Ion bombardment -- Congresses.

(1)

Ion bombardment.

(1)

Ion implantation.

(1)

Ion plating -- Congresses.

(1)

KATMANLAŞTIRILMIŞ YAPI (KATI CİSİMLER) -- KONGRELER.

(1)

KLATRAT BİLEŞİKLER -- KONGRELER.

(1)

Laser ablation -- Congresses.

(1)

Low temperatures -- Instruments -- Congresses.

(1)

MALZEMELER -- KONGRELER.

(1)

Mathematical models.

(1)

Nanophotonics -- Congresses.

(1)

Nanostructure materials.

(1)

Nanostructured materials -- Optical properties -- Congresses.

(1)

Nuclear counters -- Congresses.

(1)

Nuclear fuels -- Congresses.

(1)

Nuclear reactors -- Safety measures -- Congresses.

(1)

NÜKLEER SAYAÇLAR -- GEREÇLER -- KONGRELER.

(1)

Plasmons (Physics) -- Congresses.

(1)

Protective coatings -- Congresses.

(1)

Protective coatings.

(1)

Prozessüberwachung.

(1)

RADYOAKTİF ARTIKLARIN İMHASI -- KONGRELER.

(1)

Semiconductor doping -- Congresses.

(1)

Semiconductor films -- Congresses.

(1)

Semiconductors -- Analysis -- Congresses.

(1)

Semiconductors -- Design and construction -- Congresses.

(1)

Semiconductors -- Mathematical models -- Congresses.

(1)

Semiconductors -- Optical properties -- Congresses.

(1)

Semiconductors -- Quality control -- Congresses.

(1)

Semiconductors -- Simulation methods -- Congresses.

(1)

Semiconductors.

(1)

Silicon -- Congresses.

(1)

Silicon crystals.

(1)

Strassburg (1992)

(1)

Superconductors -- Congresses.

(1)

Superlattices as materials -- Congresses.

(1)

Supraleitender Teilchendetektor.

(1)

SİLİKON KRİSTALLERİ -- KONGRELER.

(1)

Thin films -- Congresses.

(1)

YARIİLETKEN FİLMLER -- KONGRELER.

(1)

ŞEKİLSİZ YARIİLETKENLER -- KONGRELER.

(1)

Material Type

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1.

Cover image for Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.

Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.

Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.

Author

Kaufmann, E. N., ed. Shenoy, G. K., ed.

Preferred Shelf Number

QC 762 N85 1981

Format:

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2.

Cover image for Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass

Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass

Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass

Author

Materials Research Society Annual Meeting (1881: Boston, Mass.)

Preferred Shelf Number

TD 898 M375 1981

Format:

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3.

Cover image for Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.

Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.

Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.

Author

Branz, Howard M., ed. Materials Research Society Symposium (1999 : San Francisco, Calif.)

Preferred Shelf Number

TK 7871.99.A45 A444 1999

Format:

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4.

Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Author

Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444899088

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5.

Cover image for High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A

High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A

High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A

Author

Symposium A on High Tc Superconductor Materials (1990 : Strasbourg, France) Habermeier, H.-U. Kaldis, Emanuel. Schoenes, J. European Materials Research Society.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444888846

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6.

Cover image for Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988

Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988

Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988

Author

Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444874146

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7.

Cover image for CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications

CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications

CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications

Author

Triboulet, R. Siffert, P. (Paul)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780080965130

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8.

Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects

CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects

CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects

Author

Triboulet, R. Siffert, P. (Paul)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780080464091

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9.

Cover image for Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995

Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995

Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995

Author

Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France) Rooij, N. F. de. Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France) Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444823120

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10.

Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995

C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995

C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995

Author

Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444824134

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11.

Cover image for Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995

Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995

Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995

Author

Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France) Hemment, P. L. F. (Peter L. F.)

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444824103

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12.

Cover image for Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991

Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991

Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991

Author

Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France) Matzke, Hj., 1936- Schumacher, G.

Preferred Shelf Number

ONLINE

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ScienceDirect http://www.sciencedirect.com/science/book/9780444895714

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