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International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.
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Borwein, Jonathan M. Rocha, E. M. (Eugenio M.) Rodrigues, Jos-̌Francisco.
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International Workshop on Radiometric and Geometric Calibration (2003 : Gulfport, Mississippi) Morain, Stanley A. Budge, Amelia M.
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Carson, Richard Ellis. Daube-Witherspoon, Margaret E. Herscovitch, Peter.
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Cappellini, Vito.
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International Workshop on Image and Signal Processing on the Theme of Advances in Computational Intelligence (3rd : 1996 : Manchester, England) Mertzios, B. G. (Basil G.) Liatsis, P. (Panos)
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Gelsema, Edzard S., 1937- Kanal, Laveen N.
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