Search Results for European Materials Research Society.

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

2 Results Found

00DEFAULT

Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

Author

Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780444899088

Format:

Availability

Online Library~1

Available:
Copies:

Cover image for Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988

Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988