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1. 
Cover image for Modeling of AlGaN/GaN High Electron Mobility Transistors
Modeling of AlGaN/GaN High Electron Mobility Transistors
Author 
Nirmal, D. editor. Ajayan, J. editor. (orcid)0000-0002-2398-3690 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7506-4
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2. 
Cover image for Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Single-Photon Avalanche Diodes and Photon Counting Systems From Phototransduction to Circuit Architecture
Author 
Dandin, Marc. author. McFarlane, Nicole. author. Sajal, Md Sakibur. author. Dehghandehnavi, Fahimeh. author. Nouri, Babak. author.
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-031-64334-7
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3. 
Cover image for Silicon Components and Processes Self Study Field-Effect Transistors
Silicon Components and Processes Self Study Field-Effect Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-59193-8
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4. 
Cover image for Passive and Active Circuits by Example
Passive and Active Circuits by Example
Author 
Yuce, Erkan. author. Minaei, Shahram. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-44966-6
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5. 
Cover image for Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Author 
Ciofi, Carmine. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-48711-8
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6. 
Cover image for Design and Applications of Emerging Computer Systems
Design and Applications of Emerging Computer Systems
Author 
Liu, Weiqiang. editor. Han, Jie. editor. Lombardi, Fabrizio. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-42478-6
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7. 
Cover image for Silicon-Based High-Sensitivity Broadband Receiver
Silicon-Based High-Sensitivity Broadband Receiver
Author 
Bi, Xiaojun. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-0881-9
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8. 
Cover image for Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59189-1
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9. 
Cover image for Silicon Components and Processes Self Study Unit Processes and Process Integration
Silicon Components and Processes Self Study Unit Processes and Process Integration
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59219-5
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10. 
Cover image for X-ray Photon Processing Detectors Space, Industrial, and Medical applications
X-ray Photon Processing Detectors Space, Industrial, and Medical applications
Author 
Hansson, Conny. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
Preferred Shelf Number 
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https://doi.org/10.1007/978-3-031-35241-6
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11. 
Cover image for Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Author 
van Driel, Willem Dirk. editor. Pressel, Klaus. editor. Soyturk, Mujdat. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59361-1
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12. 
Cover image for Silicon Components and Processes Self Study Integrated High-Voltage Transistors and Passive Components
Silicon Components and Processes Self Study Integrated High-Voltage Transistors and Passive Components
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59201-0
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13. 
Cover image for Silicon Components and Processes Self Study Properties of Silicon Crystals and PN Junctions
Silicon Components and Processes Self Study Properties of Silicon Crystals and PN Junctions
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-031-59185-3
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14. 
Cover image for More-than-Moore Devices and Integration for Semiconductors
More-than-Moore Devices and Integration for Semiconductors
Author 
Iacopi, Francesca. editor. Balestra, Francis. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-21610-7
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15. 
Cover image for Proceedings of SIE 2022 53rd Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2022 53rd Annual Meeting of the Italian Electronics Society
Author 
Cocorullo, Giuseppe. editor. Crupi, Felice. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-031-26066-7
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16. 
Cover image for Basic Electronic Circuits Problems and Solutions
Basic Electronic Circuits Problems and Solutions
Author 
Vasudevan, K. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-09363-0
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17. 
Cover image for Biomedical Electronics, Noise Shaping ADCs, and Frequency References Advances in Analog Circuit Design 2022
Biomedical Electronics, Noise Shaping ADCs, and Frequency References Advances in Analog Circuit Design 2022
Author 
Harpe, Pieter. editor. Baschirotto, Andrea. editor. Makinwa, Kofi A.A. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-28912-5
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18. 
Cover image for Differentiated Layout Styles for MOSFETs Electrical Behavior in Harsh Environments
Differentiated Layout Styles for MOSFETs Electrical Behavior in Harsh Environments
Author 
Gimenez, Salvador Pinillos. author. Galembeck, Egon Henrique Salerno. author. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
https://doi.org/10.1007/978-3-031-29086-2
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