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1. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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2. 
Cover image for Moderne Beschichtungsverfahren
Moderne Beschichtungsverfahren
Author 
Bach, Fr.-W. Möhwald, K. Laarmann, A. Wenz, T. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9783527604272
John Wiley http://dx.doi.org/10.1002/3527604278
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Availability 
Online Library~1
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