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1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
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2. 
Cover image for Dimensional metrology
Dimensional metrology
Author 
Haitjema, Han, author. Leach, Richard, author.
Preferred Shelf Number 
QC88
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367821746
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-23412-5
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4. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J. John Wiley & Sons.
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0470855606
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5. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
Preferred Shelf Number 
ONLINE(318819.1)
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534
MyiLibrary http://www.myilibrary.com?id=26972
John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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6. 
Cover image for Speckle metrology
Speckle metrology
Author 
Erf, Robert K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
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7. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
Author 
Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992
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8. 
Cover image for Metrology for engineers
Metrology for engineers
Author 
Galyer, J. F. W. Shotbolt, C. R., ort. yaz.
Preferred Shelf Number 
T 50 G3 1980
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9. 
Cover image for ULTRAPRECISION MACHINING AND METROLOGY
ULTRAPRECISION MACHINING AND METROLOGY
Author 
Yan, Jiwang.
Preferred Shelf Number 
QC88
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003292388
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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10. 
Cover image for INTRODUCTION TO OPTICAL METROLOGY
INTRODUCTION TO OPTICAL METROLOGY
Author 
Sirohi, R. S.
Preferred Shelf Number 
QC367
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003531845
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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11. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
Author 
Horn, Alexander, PD Dr.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071
John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
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12. 
Cover image for Handbook of Metrology and Applications
Handbook of Metrology and Applications
Author 
Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-2074-7
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