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1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-4938-5
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2. 
Cover image for Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
Author 
Gao, Wei. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-84996-254-4
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3. 
Cover image for UV Radiation in Global Climate Change Measurements, Modeling and Effects on Ecosystems
UV Radiation in Global Climate Change Measurements, Modeling and Effects on Ecosystems
Author 
Gao, Wei. editor. Slusser, James R. editor. Schmoldt, Daniel L. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03313-1
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4. 
Cover image for Earth Science Satellite Remote Sensing Vol. 2: Data, Computational Processing, and Tools
Earth Science Satellite Remote Sensing Vol. 2: Data, Computational Processing, and Tools
Author 
Qu, John J. editor. Gao, Wei. editor. Kafatos, Menas. editor. Murphy, Robert E. editor. Salomonson, Vincent V. editor.
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-37294-3
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5. 
Cover image for Earth Science Satellite Remote Sensing Vol. 1: Science and Instruments
Earth Science Satellite Remote Sensing Vol. 1: Science and Instruments
Author 
Qu, John J. editor. Gao, Wei. editor. Kafatos, Menas. editor. Murphy, Robert E. editor. Salomonson, Vincent V. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-37293-6
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6. 
Cover image for Nanotechnology in Australia showcase of early career research
Nanotechnology in Australia showcase of early career research
Author 
Kane, Deborah M. Micolich, Adam. Rabeau, James.
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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