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1. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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2. 
Cover image for Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
Author 
El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.
Preferred Shelf Number 
TA169 .A67 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678
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3. 
Cover image for Design of experiments for reliability achievement
Design of experiments for reliability achievement
Author 
Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.
Preferred Shelf Number 
TS173 .R54 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754
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4. 
Cover image for Modern industrial statistics : with applications in R, MINITAB and JMP
Modern industrial statistics : with applications in R, MINITAB and JMP
Author 
Kenett, Ron, author. Zacks, Shelemyahu, 1932- author. Amberti, Daniele, author.
Preferred Shelf Number 
TS156 .K46 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941
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5. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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6. 
Cover image for Robust statistics : theory and methods (with R)
Robust statistics : theory and methods (with R)
Author 
Maronna, Ricardo A., author. Martin, R. Douglas, author. Yohai, Víctor J., author.
Preferred Shelf Number 
QA276 .M336 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656
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7. 
Cover image for Practical applications of Bayesian reliability
Practical applications of Bayesian reliability
Author 
Liu, Yan, author. Abeyratne, Athula I., author.
Preferred Shelf Number 
QA279.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995
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8. 
Cover image for Analytic methods in systems and software testing
Analytic methods in systems and software testing
Author 
Kenett, Ron, editor. Ruggeri, Fabrizio, editor. Faltin, Frederick W., editor.
Preferred Shelf Number 
QA76.76 .T48 A52 2018 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056
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