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Publication Date: 2001
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Güngör, Tayyar.
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Okat, Tolga.
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Amorphous semiconductors.
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Silicon.
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SİLİSYUM.
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ŞEKİLSİZ YARIİLETKENLER.
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Hidrojenlendirilmiş amorf silisyum filimlerde uzay yükü ile sınırlı akım tekniği ile durum yoğunluğunun belirlenmesi
Hidrojenlendirilmiş amorf silisyum filimlerde uzay yükü ile sınırlı akım tekniği ile durum yoğunluğunun belirlenmesi
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Okat, Tolga.
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TEZ/5179 O1 2001
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Hidrojenlendirilmiş amorf silisyum filmlerin optik katsayılarını belirlemede kullanılan deneysel yöntemlerin karşılaştırılması = Comparison of experimental methods used for determination of optical constants of hydogenated amorphous silicon
Hidrojenlendirilmiş amorf silisyum filmlerin optik katsayılarını belirlemede kullanılan deneysel yöntemlerin karşılaştırılması = Comparison of experimental methods used for determination of optical constants of hydogenated amorphous silicon
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Güngör, Tayyar.
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TEZ 4864 .G86 2001
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