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1. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
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2. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73886-2
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3. 
Cover image for EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
Author 
Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85226-1
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4. 
Cover image for Microstructural characterization of materials
Microstructural characterization of materials
Author 
Brandon, D. G. Kaplan, Wayne D. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Online text
http://onlinelibrary.wiley.com/book/10.1002/9780470727133
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287
John Wiley http://dx.doi.org/10.1002/9780470727133
MyiLibrary, Table of contents http://www.myilibrary.com?id=234294&ref=toc
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