Switch to list view
Switch to thumbnail view
Select an Action
4 Results Found Subscribe to search results
0000DEFAULT
Print
1. 
Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-67104-8
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for The GENI Book
The GENI Book
Author 
McGeer, Rick. editor. Berman, Mark. editor. Elliott, Chip. editor. Ricci, Robert. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-33769-2
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Recent Advances in Communication Networks and Embedded Systems Proceedings of 6th International Conference on Communication and Network Technology
Recent Advances in Communication Networks and Embedded Systems Proceedings of 6th International Conference on Communication and Network Technology
Author 
Femmam, Smain. editor. (orcid)0000-0001-5366-0481 Lorenz, Pascal. editor. (orcid)0000-0003-3346-7216 SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59619-3
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-46097-0
Format: 
Availability 
Online Library~1
Available:
Copies: