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1. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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2. 
Cover image for RF measurements for cellular phones and wireless data systems
RF measurements for cellular phones and wireless data systems
Author 
Scott, Allan W. Frobenius, Rex.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014
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Online Library~1
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3. 
Cover image for Integrated circuit manufacturability the art of process and design integration
Integrated circuit manufacturability the art of process and design integration
Author 
Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097
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Online Library~1
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4. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
Format: 
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Online Library~1
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