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1. 
Cover image for CMOS Plasma and Process Damage
CMOS Plasma and Process Damage
Author 
Prall, Kirk. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-89029-1
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2. 
Cover image for Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
Author 
van Driel, Willem Dirk. editor. Pressel, Klaus. editor. Soyturk, Mujdat. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59361-1
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