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1. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1349-7
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4. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-2360-5
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5. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
Author 
Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-98965-5
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8. 
Cover image for Critical mm-Wave Components for Synthetic Automatic Test Systems
Critical mm-Wave Components for Synthetic Automatic Test Systems
Author 
Hrobak, Michael. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-658-09763-9
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9. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1359-2
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10. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9976-4
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11. 
Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author 
Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9398-1
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12. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9725-5
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