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Contactless VLSI Measurement and Testing Techniques

Author

Sayil, Selahattin. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-69673-7

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Design, Modeling and Testing of Data Converters

Author

Carbone, Paolo. editor. Kiaei, Sayfe. editor. Xu, Fang. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-642-39655-7

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Design and Testing of Digital Microfluidic Biochips

Author

Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(331239.1)

Electronic Access

http://dx.doi.org/10.1007/978-1-4614-0370-8

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Author

Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-46547-2

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Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

Author

Zhuang, Yuming. author. Chen, Degang. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-77718-4

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Innovative Design, Manufacturing and Testing of Small Satellites

Author

Madry, Scott. author. Martinez, Peter. author. Laufer, Rene. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-75094-1

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The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects

Author

Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-85729-236-0

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Timing Performance of Nanometer Digital Circuits Under Process Variations

Author

Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-75465-9

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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

Author

Tehranipoor, Mohammad. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-387-74747-7

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10.

Gizopoulos / Advances in ElectronicTesting

Author

Gizopoulos, Dimitris. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-29409-0

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11.

Digital Timing Measurements From Scopes and Probes to Timing and Jitter

Author

Maichen, Wolfgang. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-387-31419-8

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12.

The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™

Author

Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-34609-0

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