Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author 
Shen, Ruijing. author. Tan, Sheldon X.-D. author. Yu, Hao. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0788-1
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Symbolic Analysis and Reduction of VLSI Circuits
Symbolic Analysis and Reduction of VLSI Circuits
Author 
Qin, Zhanhai. author. Tan, Sheldon X. D. author. Cheng, Chung-Kuan. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b103124
Format: 
Availability 
Online Library~1
Available:
Copies: