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Cover image for Passivation of metals and semiconductors, and properties of thin oxide layers a selection of papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005

Passivation of metals and semiconductors, and properties of thin oxide layers a selection of papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005

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International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers (9th : 2005 : Paris, France) Marcus, P. (Philippe), 1953- Maurice, Vincent.

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ScienceDirect http://www.sciencedirect.com/science/book/9780444522245

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Online Library~1

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Cover image for Sensors, sampling, and simulation for process control proceedings of a symposium sponsored by the Process Technology and Modeling Committee and the Solidification Committee of the Extraction and Processing Division of TMS (The Minerals, Metals & Materials Society) and Association for Iron and Steel Technology (AIST), held during the TMS 2011 Annual Meeting & Exhibition, San Diego, California, USA, February 27-March 3, 2011

Sensors, sampling, and simulation for process control proceedings of a symposium sponsored by the Process Technology and Modeling Committee and the Solidification Committee of the Extraction and Processing Division of TMS (The Minerals, Metals & Materials Society) and Association for Iron and Steel Technology (AIST), held during the TMS 2011 Annual Meeting & Exhibition, San Diego, California, USA, February 27-March 3, 2011