Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
7 Results Found Subscribe to search results
0000000DEFAULT
Print
1. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley Online Library
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
T174.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Metrology and Measurement Uncertainty Concepts and Applications
Metrology and Measurement Uncertainty Concepts and Applications
Author 
Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-82303-9
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Advances in Metrology Select Proceedings of AdMet 2024
Advances in Metrology Select Proceedings of AdMet 2024
Author 
Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-6418-4
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Handbook of Metrology and Applications
Handbook of Metrology and Applications
Author 
Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-2074-7
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE(355774.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080964546
Format: 
Availability 
Online Library~1
Available:
Copies: