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1. 
Cover image for Design and analysis of accelerated tests for mission critical reliability
Design and analysis of accelerated tests for mission critical reliability
Author 
LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.
Preferred Shelf Number 
TA169.3 .L88 2004
Electronic Access 
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2. 
Cover image for Reliability analysis of modern power systems
Reliability analysis of modern power systems
Author 
Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-
Preferred Shelf Number 
TA169 .S234 2024
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771
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3. 
Cover image for Product maturity. 2, Principles and illustrations
Product maturity. 2, Principles and illustrations
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342
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4. 
Cover image for Product maturity. 1, Theoretical principals and industrial applications
Product maturity. 1, Theoretical principals and industrial applications
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232
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5. 
Cover image for Reliability and Physics-Of-Healthy in Mechatronics.
Reliability and Physics-Of-Healthy in Mechatronics.
Author 
El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.
Preferred Shelf Number 
TA169 .E515 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068
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6. 
Cover image for Reliability engineering
Reliability engineering
Author 
Elsayed, Elsayed A., author.
Preferred Shelf Number 
TA169 .E52 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946
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7. 
Cover image for Photovoltaic module reliability
Photovoltaic module reliability
Author 
Wohlgemuth, J. (John), 1946- author.
Preferred Shelf Number 
TK8322
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019
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8. 
Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Author 
Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.
Preferred Shelf Number 
TA169.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692
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