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1. 
Cover image for Simple statistical methods for software engineering : data and patterns
Simple statistical methods for software engineering : data and patterns
Author 
Pandian, C. Ravindranath, author. Kumar S. K., Murali, author.
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2. 
Cover image for Rapid prototyping of software for avionics systems : model-oriented approaches for complex systems certification
Rapid prototyping of software for avionics systems : model-oriented approaches for complex systems certification
Author 
Larrieu, Nicolas, author. Varet, Antoine, author.
Preferred Shelf Number 
ONLINE(342171.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781119050643
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3. 
Cover image for Computer, network, software, and hardware engineering with applications
Computer, network, software, and hardware engineering with applications
Author 
Schneidewind, Norman.
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ONLINE
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IEEEXplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884
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4. 
Cover image for Semantic web and model-driven engineering
Semantic web and model-driven engineering
Author 
Parreiras, Fernando Silva. Wiley InterScience (Online service)
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6218883
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5. 
Cover image for Making sense of agile project management balancing control and agility
Making sense of agile project management balancing control and agility
Author 
Cobb, Charles G., 1945-
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ONLINE
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Books24x7 http://www.books24x7.com/marc.asp?bookid=40741
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9781118085950
Cover image http://catalogimages.wiley.com/images/db/jimages/9780470943366.jpg
http://site.ebrary.com/lib/alltitles/Doc?id=10447802
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6. 
Cover image for Managing and leading software projects
Managing and leading software projects
Author 
Fairley, R. E. (Richard E.), 1937- IEEE Computer Society.
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ONLINE
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IEEE Xplore An electronic book accessible through the World Wide Web; click for information
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7. 
Cover image for Systems and software engineering with applications
Systems and software engineering with applications
Author 
Schneidewind, Norman.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539
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8. 
Cover image for Practical support for lean six sigma software process definition using IEEE software engineering standards
Practical support for lean six sigma software process definition using IEEE software engineering standards
Author 
Land, Susan K. Smith, Douglas Burr, 1943- Walz, John W.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687
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9. 
Cover image for Dependability benchmarking for computer systems
Dependability benchmarking for computer systems
Author 
Kanoun, Karama. Spainhower, Lisa.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686
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10. 
Cover image for IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional
IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional
Author 
Naveda, J. Fernando. Seidman, Stephen B.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366
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11. 
Cover image for Software measurement and estimation a practical approach
Software measurement and estimation a practical approach
Author 
Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896
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12. 
Cover image for The cognitive dynamics of computer science cost-effective large scale software development
The cognitive dynamics of computer science cost-effective large scale software development
Author 
De Gyurky, Szabolcs Michael. Tarbell, Mark A. John Wiley & Sons.
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429
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