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1. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
Author 
Abran, Alain, 1949-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
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Cover image for Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Author 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
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http://dx.doi.org/10.1007/978-3-642-05415-0
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3. 
Cover image for COSMIC function points theory and advanced practices
COSMIC function points theory and advanced practices
Author 
Dumke, Reiner. Abran, Alain, 1949-
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Distributed by publisher. Purchase or institutional license may be required for access.
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4. 
Cover image for Software maintenance management evaluation and continuous improvement
Software maintenance management evaluation and continuous improvement
Author 
April, Alain, 1958- Abran, Alain, 1949-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129685
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5. 
Cover image for Software Engineering Research, Management and Applications 2010
Software Engineering Research, Management and Applications 2010
Author 
Lee, Roger. editor. Ormandjieva, Olga. editor. Abran, Alain. editor. Constantinides, Constantinos. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-13273-5
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6. 
Cover image for Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Author 
Cuadrado-Gallego, Juan J. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Abran, Alain. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85553-8
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7. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Author 
Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.
Preferred Shelf Number 
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http://dx.doi.org/10.1007/978-3-540-89403-2
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