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1. 
Cover image for Self-restructuring in Fault Tolerant Architecture Processor Arrays with Spares
Self-restructuring in Fault Tolerant Architecture Processor Arrays with Spares
Author 
Takanami, Itsuo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-1539-1
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2. 
Cover image for 33rd International Conference on Organization and Technology of Maintenance (OTO 2024)
33rd International Conference on Organization and Technology of Maintenance (OTO 2024)
Author 
Glavaš, Hrvoje. editor. Hadzima-Nyarko, Marijana. editor. (orcid)0000-0002-9500-7285 Ademović, Naida. editor. (orcid)0000-0003-3099-8265 Hanák, Tomáš. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-80597-4
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3. 
Cover image for Software Design for Resilient Computer Systems
Software Design for Resilient Computer Systems
Author 
Schagaev, Igor. author. Gutknecht, Jürg. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-55139-0
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4. 
Cover image for Smart grids for smart cities. Volume 1
Smart grids for smart cities. Volume 1
Author 
Swathika, O. V. Gnana, editor. Karthikeyan, K., editor. Sanjeevikumar, Padmanaban, 1978- editor.
Preferred Shelf Number 
TK3105 .S63 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872108
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5. 
Cover image for Body of Knowledge for Modeling and Simulation A Handbook by the Society for Modeling and Simulation International
Body of Knowledge for Modeling and Simulation A Handbook by the Society for Modeling and Simulation International
Author 
Ören, Tuncer. editor. Zeigler, Bernard P. editor. Tolk, Andreas. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-11085-6
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6. 
Cover image for Functional safety for embedded systems
Functional safety for embedded systems
Author 
Xie, Guoqi, 1983- author. Zhang, Yawen, author. Li, Renfa, author. Li, Kenli, author. Li, Keqin, 1963- author.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003391517
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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8. 
Cover image for Role of edge analytics in sustainable smart city development : challenges and solutions
Role of edge analytics in sustainable smart city development : challenges and solutions
Author 
Kanagachidambaresan, G. R., 1988- editor.
Preferred Shelf Number 
TD159.4 .R65 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681328
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9. 
Cover image for The Electrical Engineering Handbook - Six Volume Set
The Electrical Engineering Handbook - Six Volume Set
Author 
Dorf, Richard C., editor. Taylor and Francis.
Preferred Shelf Number 
R857 .B54
Electronic Access 
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10. 
Cover image for Software Design for Resilient Computer Systems
Software Design for Resilient Computer Systems
Author 
Schagaev, Igor. author. Thomas, Kaegi. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-29465-0
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11. 
Cover image for Computer system reliability : safety and usability
Computer system reliability : safety and usability
Author 
Dhillon, B. S., author.
Preferred Shelf Number 
QA76.76 .R44 D495 2013
Electronic Access 
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12. 
Cover image for Tutorial on hardware and software reliability, maintainability, and availability
Tutorial on hardware and software reliability, maintainability, and availability
Author 
Schneidewind, Norman.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540
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