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Cover image for Scanning transmission electron microscopy : advanced characterization methods for materials science applications
Scanning transmission electron microscopy : advanced characterization methods for materials science applications
Author 
Bruma, Alina, editor.
Preferred Shelf Number 
QH212 .S34 S33 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429243011
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Computed electron micrographs and defect identification
Computed electron micrographs and defect identification
Author 
Head, A. K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780720417579
Format: 
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