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1. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37231-8
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2. 
Cover image for Conductive atomic force microscopy : applications in nanomaterials
Conductive atomic force microscopy : applications in nanomaterials
Author 
Lanza, Mario.
Preferred Shelf Number 
QH212 .A78
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773
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Availability 
Online Library~1
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