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1. 
Cover image for Analog circuit design : fractional-N synthesizers, design for robustness, line and bus drivers
Analog circuit design : fractional-N synthesizers, design for robustness, line and bus drivers
Author 
Roermund, Arthur H. M. van. Steyaert, Michiel. Huijsing, Johan H.
Preferred Shelf Number 
TK7874.654 W67 2003
Format: 
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2. 
Cover image for Proceedings 2001 : Eleventh Great Lakes Symposium on VLSI ; Purdue University, West Lafayette, Indiana, March 22-23, 2001
Proceedings 2001 : Eleventh Great Lakes Symposium on VLSI ; Purdue University, West Lafayette, Indiana, March 22-23, 2001
Author 
Great Lakes Symposium on VLSI (11th : 2001 : West Lafayette, Ind.) Association for Computing Machinery. ACM, SIGDA.
Preferred Shelf Number 
TK 7874 G689 2001
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3. 
Cover image for Proceedings of ISPD'01 : 2001 International Symposium on Physical Design ; Sonoma, California, USA, April 1-4, 2001
Proceedings of ISPD'01 : 2001 International Symposium on Physical Design ; Sonoma, California, USA, April 1-4, 2001
Author 
International Symposium on Physical Design (2001 : Sonoma, Calif.) ACM/SIGDA in cooperation with IEEE.
Preferred Shelf Number 
TK 7874.75 I58 2001
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4. 
Cover image for Algorithms and parallel VLSI architectures III proceedings of the International Workshop, Algorithms and Parallel VLSI Architectures III, Leuven, Belgium, August 29-31, 1994
Algorithms and parallel VLSI architectures III proceedings of the International Workshop, Algorithms and Parallel VLSI Architectures III, Leuven, Belgium, August 29-31, 1994
Author 
International Workshop on Algorithms and Parallel VLSI Architectures (3rd : 1994 : Louvain, Belgium) Moonen, Marc S., 1963- Catthoor, Francky.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444821065
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5. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
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6. 
Cover image for Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Author 
Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833
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