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1. 
Cover image for Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Author 
Klapetek, Petr.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780128133477
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2. 
Cover image for Proceedings of the 11th European Conference on Thermoelectrics ECT 2013
Proceedings of the 11th European Conference on Thermoelectrics ECT 2013
Author 
Amaldi, Andrea. editor. Tang, Francois. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-07332-3
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3. 
Cover image for Silicon heterostructure handbook : materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxy
Silicon heterostructure handbook : materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxy
Author 
Cressler, John D.
Preferred Shelf Number 
TK7871.96 .B55 S55 2005
Electronic Access 
Click here to view.
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