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1. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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2. 
Cover image for Integrated passive component technology
Integrated passive component technology
Author 
Ulrich, Richard K. (Richard Kevin), 1955- Schaper, Leonard W.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5426840
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3. 
Cover image for Low-power CMOS design
Low-power CMOS design
Author 
Chandrakasan, Anantha P. Brodersen, Robert W., 1945-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263696
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4. 
Cover image for Designing with speech processing chips
Designing with speech processing chips
Author 
Jiménez, Ricardo.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123853486
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