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SirsiDynix Enterprise
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2024-08-26T23:24:02Z
Particle Size Measurements Fundamentals, Practice, Quality
ent://SD_ILS/0/SD_ILS:170410
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2024-08-26T23:24:02Z
Author Merkus, Henk G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Microscopy of Semiconducting Materials 2007
ent://SD_ILS/0/SD_ILS:170247
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2024-08-26T23:24:02Z
Author Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural Synthesis in Precision Elasticity
ent://SD_ILS/0/SD_ILS:165105
2024-08-26T23:24:02Z
2024-08-26T23:24:02Z
Author Tseytlin, Yakov M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b105079">http://dx.doi.org/10.1007/b105079</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>