Search Results for - Narrowed by: SpringerLink (Online service) - Electronic Library - 2013 - Solid State Physics. - Systems engineering.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dPUBDATE$002509Publication$002bDate$0025092013$0025092013$0026qf$003dSUBJECT$002509Subject$002509Solid$002bState$002bPhysics.$002509Solid$002bState$002bPhysics.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026rt$003dfalse$00257C$00257C$00257CISBN$00257C$00257C$00257CISBN$0026ps$003d300$0026isd$003dtrue?
2024-08-22T22:26:50Z
Inside Solid State Drives (SSDs)
ent://SD_ILS/0/SD_ILS:335898
2024-08-22T22:26:50Z
2024-08-22T22:26:50Z
Author Micheloni, Rino. author. Marelli, Alessia. author. Eshghi, Kam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335898.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-5146-0">http://dx.doi.org/10.1007/978-94-007-5146-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
ent://SD_ILS/0/SD_ILS:336233
2024-08-22T22:26:50Z
2024-08-22T22:26:50Z
Author Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(336233.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-6392-0">http://dx.doi.org/10.1007/978-94-007-6392-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>