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SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Spectrum$002banalysis.$002509Spectrum$002banalysis.$0026te$003dILS$0026rt$003dfalse$00257C$00257C$00257CISBN$00257C$00257C$00257CISBN$0026ps$003d300?
2024-07-26T05:06:47Z
Science with the VLT in the ELT Era
ent://SD_ILS/0/SD_ILS:170465
2024-07-26T05:06:47Z
2024-07-26T05:06:47Z
Author Moorwood, Alan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9190-2">http://dx.doi.org/10.1007/978-1-4020-9190-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
ent://SD_ILS/0/SD_ILS:181391
2024-07-26T05:06:47Z
2024-07-26T05:06:47Z
Author Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>