Search Results for - Narrowed by: English - 2019 - Electronic circuits. - Reliability.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092019$0025092019$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026qf$003dSUBJECT$002509Subject$002509Reliability.$002509Reliability.$0026ps$003d300$0026isd$003dtrue?dt=list
2024-07-17T13:37:10Z
The Electrical Contact of the Pantograph-Catenary System Theory and Application
ent://SD_ILS/0/SD_ILS:483474
2024-07-17T13:37:10Z
2024-07-17T13:37:10Z
Author Wu, Guangning. author. Gao, Guoqiang. author. Wei, Wenfu. author. Yang, Zefeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-6589-8">https://doi.org/10.1007/978-981-13-6589-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2024-07-17T13:37:10Z
2024-07-17T13:37:10Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2024-07-17T13:37:10Z
2024-07-17T13:37:10Z
Author Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>