Search Results for - Narrowed by: 2019 - Electronic circuits. - Quality control. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qf$003dPUBDATE$002509Publication$002bDate$0025092019$0025092019$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026qf$003dSUBJECT$002509Subject$002509Quality$002bcontrol.$002509Quality$002bcontrol.$0026ps$003d300$0026isd$003dtrue? 2024-08-27T02:49:08Z Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:482935 2024-08-27T02:49:08Z 2024-08-27T02:49:08Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI Design and Test for Systems Dependability ent://SD_ILS/0/SD_ILS:483711 2024-08-27T02:49:08Z 2024-08-27T02:49:08Z Author&#160;Asai, Shojiro. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>