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SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Subject$002509Operating$002bsystems$002b$002528Computers$002529.$002509Operating$002bsystems$002b$002528Computers$002529.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ic$003dtrue$0026te$003dILS$0026rt$003dfalse$00257C$00257C$00257CISBN$00257C$00257C$00257CISBN$0026ps$003d300$0026isd$003dtrue? 2024-08-27T04:32:44Z System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses ent://SD_ILS/0/SD_ILS:401188 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Kochs, Hans-Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-64991-7">https://doi.org/10.1007/978-3-319-64991-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design, Analysis and Test of Logic Circuits Under Uncertainty ent://SD_ILS/0/SD_ILS:335669 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Krishnaswamy, Smita. author.&#160;Markov, Igor L. author.&#160;Hayes, John P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335669.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault-Tolerant Design ent://SD_ILS/0/SD_ILS:331297 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Dubrova, Elena. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331297.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Test and Diagnosis for Small-Delay Defects ent://SD_ILS/0/SD_ILS:173108 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Tehranipoor, Mohammad. author.&#160;Peng, Ke. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI 2010 Annual Symposium Selected papers ent://SD_ILS/0/SD_ILS:206081 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Voros, Nikolaos. editor.&#160;Mukherjee, Amar. editor.&#160;Sklavos, Nicolas. editor.&#160;Masselos, Konstantinos. editor.&#160;Huebner, Michael. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-1488-5">http://dx.doi.org/10.1007/978-94-007-1488-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Predictive Technology Model for Robust Nanoelectronic Design ent://SD_ILS/0/SD_ILS:173686 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Cao, Yu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0445-3">http://dx.doi.org/10.1007/978-1-4614-0445-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Soft Errors in Modern Electronic Systems ent://SD_ILS/0/SD_ILS:172744 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Nicolaidis, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault ent://SD_ILS/0/SD_ILS:205032 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Wunderlich, Hans-Joachim. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3282-9">http://dx.doi.org/10.1007/978-90-481-3282-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software-Implemented Hardware Fault Tolerance ent://SD_ILS/0/SD_ILS:165890 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Goloubeva, Olga. author.&#160;Rebaudengo, Maurizio. author.&#160;Reorda, Matteo Sonza. author.&#160;Violante, Massimo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32937-4">http://dx.doi.org/10.1007/0-387-32937-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Gizopoulos / Advances in ElectronicTesting ent://SD_ILS/0/SD_ILS:165642 2024-08-27T04:32:44Z 2024-08-27T04:32:44Z Author&#160;Gizopoulos, Dimitris. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>