Search Results for - Narrowed by: Failure time data analysis.
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Interval-censored time-to-event data : methods and applications
ent://SD_ILS/0/SD_ILS:538721
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Author Chen, Ding-Geng. Sun, Jianguo, 1961- Peace, Karl E., 1941-<br/>Preferred Shelf Number QA276 .I58 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466504288">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Multivariate survival analysis and competing risks
ent://SD_ILS/0/SD_ILS:538763
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Author Crowder, M. J. (Martin J.), 1943, author.<br/>Preferred Shelf Number QA276 .C83 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439875223">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Mathematical methods in survival analysis, reliability and quality of life
ent://SD_ILS/0/SD_ILS:297543
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Author Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Counting processes and survival analysis
ent://SD_ILS/0/SD_ILS:300344
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Author Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a>
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Accelerated testing and validation testing, engineering, and management tools for lean development
ent://SD_ILS/0/SD_ILS:254184
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Author Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical methods for survival data analysis
ent://SD_ILS/0/SD_ILS:301512
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Author Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139">http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical models and methods for lifetime data
ent://SD_ILS/0/SD_ILS:301856
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Author Lawless, Jerald F., 1944-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The statistical analysis of failure time data
ent://SD_ILS/0/SD_ILS:301855
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Author Kalbfleisch, J. D. Prentice, Ross L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a>
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The statistical analysis of failure time data
ent://SD_ILS/0/SD_ILS:109264
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Author Kalbfleisch, J. D. Prentice, Ross L., ort. yaz.<br/>Preferred Shelf Number QA276 .K215 2002<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Bayesian survival analysis
ent://SD_ILS/0/SD_ILS:91219
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Author Ibrahim, Joseph George. Chen, Ming-Hui, 1961- Sinha, Debajyoti.<br/>Preferred Shelf Number QA 276 I27 2001<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Classical competing risks
ent://SD_ILS/0/SD_ILS:75843
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Author Crowder, Martin J., 1943-<br/>Preferred Shelf Number QA 273 C855 2001<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Subjective probability models for lifetimes
ent://SD_ILS/0/SD_ILS:538934
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Author Spizzichino, F. (Fabio), 1948, author.<br/>Preferred Shelf Number QA276 .S66 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420036138">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Classical competing risks
ent://SD_ILS/0/SD_ILS:544845
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Author Crowder, M. J. (Martin J.), 1943, author.<br/>Preferred Shelf Number QA273 .C855 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420035902">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Accelerated testing statistical models, test plans and data analyses
ent://SD_ILS/0/SD_ILS:295259
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Author Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>