Search Results for -- AMERİKAN EDEBİYATI -- 20. YÜZYIL -- TARİHÇE VE ELEŞTİRME. - Narrowed by: Kawata, Satoshi. editor. - Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bAMER$0025C4$0025B0KAN$002bEDEB$0025C4$0025B0YATI$002b--$002b20.$002bY$0025C3$00259CZYIL$002b--$002bTAR$0025C4$0025B0H$0025C3$002587E$002bVE$002bELE$0025C5$00259ET$0025C4$0025B0RME.$0026qf$003dAUTHOR$002509Author$002509Kawata$00252C$002bSatoshi.$002beditor.$002509Kawata$00252C$002bSatoshi.$002beditor.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
2024-09-10T04:08:53Z
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-09-10T04:08:53Z
2024-09-10T04:08:53Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-09-10T04:08:53Z
2024-09-10T04:08:53Z
Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>