SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bAMER$0025C4$0025B0KAN$002bEDEB$0025C4$0025B0YATI$002b--$002b20.$002bY$0025C3$00259CZYIL$002b--$002bTAR$0025C4$0025B0H$0025C3$002587E$002bVE$002bELE$0025C5$00259ET$0025C4$0025B0RME.$0026qf$003dSUBJECT$002509Subject$002509Metrology.$002509Metrology.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-10T03:40:37Z ent://SD_ILS/0/SD_ILS:424285 2024-09-10T03:40:37Z 2024-09-10T03:40:37Z Author&#160;Mansfield, Elisabeth, editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke, editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ent://SD_ILS/0/SD_ILS:145816 2024-09-10T03:40:37Z 2024-09-10T03:40:37Z Author&#160;Leach, R. K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ent://SD_ILS/0/SD_ILS:355774 2024-09-10T03:40:37Z 2024-09-10T03:40:37Z Author&#160;Leach, R. K.<br/>Preferred Shelf Number&#160;ONLINE(355774.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a> <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>