Search Results for -- AMER&#304;KAN EDEB&#304;YATI -- 20. Y&Uuml;ZYIL -- TAR&#304;H&Ccedil;E VE ELE&#350;T&#304;RME. - Narrowed by: Microscopy. - Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bAMER$0025C4$0025B0KAN$002bEDEB$0025C4$0025B0YATI$002b--$002b20.$002bY$0025C3$00259CZYIL$002b--$002bTAR$0025C4$0025B0H$0025C3$002587E$002bVE$002bELE$0025C5$00259ET$0025C4$0025B0RME.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-10T02:23:12Z Coherent Light Microscopy Imaging and Quantitative Phase Analysis ent://SD_ILS/0/SD_ILS:193093 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Ferraro, Pietro. editor.&#160;Wax, Adam. editor.&#160;Zalevsky, Zeev. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Radiometry in Modern Scientific Experiments ent://SD_ILS/0/SD_ILS:197693 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Pravilov, A. M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Transmission Electron Microscopy Imaging and Analysis ent://SD_ILS/0/SD_ILS:172802 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Pennycook, Stephen J. editor.&#160;Nellist, Peter D. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pharmaceutical Microscopy ent://SD_ILS/0/SD_ILS:173165 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Carlton, Robert Allen. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Sample Preparation Handbook for Transmission Electron Microscopy Techniques ent://SD_ILS/0/SD_ILS:172475 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Ayache, Jeanne. author.&#160;Beaunier, Luc. author.&#160;Boumendil, Jacqueline. author.&#160;Ehret, Gabrielle. author.&#160;Laub, Dani&egrave;le. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Sample Preparation Handbook for Transmission Electron Microscopy Methodology ent://SD_ILS/0/SD_ILS:168096 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Ayache, Jeanne. author.&#160;Beaunier, Luc. author.&#160;Boumendil, Jacqueline. author.&#160;Ehret, Gabrielle. author.&#160;Laub, Dani&egrave;le. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis ent://SD_ILS/0/SD_ILS:167790 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Echlin, Patrick. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electron Tomography Methods for Three-Dimensional Visualization of Structures in the Cell ent://SD_ILS/0/SD_ILS:166679 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Frank, Joachim. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-69008-7">http://dx.doi.org/10.1007/978-0-387-69008-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM ent://SD_ILS/0/SD_ILS:165220 2024-09-10T02:23:12Z 2024-09-10T02:23:12Z Author&#160;Egerton, Ray F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>