Search Results for -- AMERİKAN EDEBİYATI -- 20. YÜZYIL -- TARİHÇE VE ELEŞTİRME. - Narrowed by: Nanotechnology. - System safety.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bAMER$0025C4$0025B0KAN$002bEDEB$0025C4$0025B0YATI$002b--$002b20.$002bY$0025C3$00259CZYIL$002b--$002bTAR$0025C4$0025B0H$0025C3$002587E$002bVE$002bELE$0025C5$00259ET$0025C4$0025B0RME.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
2024-09-10T03:06:21Z
Nanomaterials: A Danger or a Promise? A Chemical and Biological Perspective
ent://SD_ILS/0/SD_ILS:330931
2024-09-10T03:06:21Z
2024-09-10T03:06:21Z
Author Brayner, Roberta. editor. Fiévet, Fernand. editor. Coradin, Thibaud. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330931.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4213-3">http://dx.doi.org/10.1007/978-1-4471-4213-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk Management and Governance Concepts, Guidelines and Applications
ent://SD_ILS/0/SD_ILS:192493
2024-09-10T03:06:21Z
2024-09-10T03:06:21Z
Author Aven, Terje. author. Renn, Ortwin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-13926-0">http://dx.doi.org/10.1007/978-3-642-13926-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Particle Size Measurements Fundamentals, Practice, Quality
ent://SD_ILS/0/SD_ILS:170410
2024-09-10T03:06:21Z
2024-09-10T03:06:21Z
Author Merkus, Henk G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-09-10T03:06:21Z
2024-09-10T03:06:21Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Force Sensors for Microelectronic Packaging Applications
ent://SD_ILS/0/SD_ILS:181096
2024-09-10T03:06:21Z
2024-09-10T03:06:21Z
Author Schwizer, Jürg. author. Mayer, Michael. author. Brand, Oliver. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>