Search Results for -- ANSİKLOPEDİLER. - Narrowed by: E-Book - Online Library - Nanotechnology. - System safety.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bANS$0025C4$0025B0KLOPED$0025C4$0025B0LER.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list
2024-08-14T11:54:45Z
Nanomaterials: A Danger or a Promise? A Chemical and Biological Perspective
ent://SD_ILS/0/SD_ILS:330931
2024-08-14T11:54:45Z
2024-08-14T11:54:45Z
Author Brayner, Roberta. editor. Fiévet, Fernand. editor. Coradin, Thibaud. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330931.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4213-3">http://dx.doi.org/10.1007/978-1-4471-4213-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk Management and Governance Concepts, Guidelines and Applications
ent://SD_ILS/0/SD_ILS:192493
2024-08-14T11:54:45Z
2024-08-14T11:54:45Z
Author Aven, Terje. author. Renn, Ortwin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-13926-0">http://dx.doi.org/10.1007/978-3-642-13926-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Particle Size Measurements Fundamentals, Practice, Quality
ent://SD_ILS/0/SD_ILS:170410
2024-08-14T11:54:45Z
2024-08-14T11:54:45Z
Author Merkus, Henk G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-08-14T11:54:45Z
2024-08-14T11:54:45Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Force Sensors for Microelectronic Packaging Applications
ent://SD_ILS/0/SD_ILS:181096
2024-08-14T11:54:45Z
2024-08-14T11:54:45Z
Author Schwizer, Jürg. author. Mayer, Michael. author. Brand, Oliver. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>