Search Results for -- ANS&#304;KLOPED&#304;LER. - Narrowed by: English - 2011 - Engineering. - Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bANS$0025C4$0025B0KLOPED$0025C4$0025B0LER.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092011$0025092011$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-10T13:22:29Z IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials Proceedings of the IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials, held in Freiberg, Germany, September 1-4, 2009 ent://SD_ILS/0/SD_ILS:205621 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Kuna, Meinhard. editor.&#160;Ricoeur, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic 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2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Proulx, Tom. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0216-9">http://dx.doi.org/10.1007/978-1-4614-0216-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ent://SD_ILS/0/SD_ILS:191386 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in the Processing of Wood-Plastic Composites ent://SD_ILS/0/SD_ILS:192798 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Kim, Jin Kuk. author.&#160;Pal, Kaushik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14877-4">http://dx.doi.org/10.1007/978-3-642-14877-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor-On-Insulator Materials for Nanoelectronics Applications ent://SD_ILS/0/SD_ILS:193111 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Nazarov, Alexei. editor.&#160;Colinge, J.-P. editor.&#160;Balestra, Francis. editor.&#160;Raskin, Jean-Pierre. editor.&#160;Gamiz, Francisco. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15868-1">http://dx.doi.org/10.1007/978-3-642-15868-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fabrication and Characterization in the Micro-Nano Range New Trends for Two and Three Dimensional Structures ent://SD_ILS/0/SD_ILS:193706 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editor.&#160;Murch, Graeme E. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04403-8">http://dx.doi.org/10.1007/978-3-642-04403-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanotribology and Nanomechanics II Nanotribology, Biomimetics, and Industrial Applications ent://SD_ILS/0/SD_ILS:192913 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15263-4">http://dx.doi.org/10.1007/978-3-642-15263-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Laser Processing and Chemistry ent://SD_ILS/0/SD_ILS:193654 2024-09-10T13:22:29Z 2024-09-10T13:22:29Z Author&#160;B&auml;uerle, Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred 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