Search Results for -- ANS&#304;KLOPED&#304;LER. - Narrowed by: Engineering. - Surfaces (Physics). - System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bANS$0025C4$0025B0KLOPED$0025C4$0025B0LER.$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-10T12:31:46Z Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems ent://SD_ILS/0/SD_ILS:333141 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Czichos, Horst. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333141.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25850-3">http://dx.doi.org/10.1007/978-3-642-25850-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Mass Determination ent://SD_ILS/0/SD_ILS:191843 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Borys, Michael. author.&#160;Schwartz, Roman. author.&#160;Reichmuth, Arthur. author.&#160;Nater, Roland. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11937-8">http://dx.doi.org/10.1007/978-3-642-11937-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials Proceedings of the IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials, held in Freiberg, Germany, September 1-4, 2009 ent://SD_ILS/0/SD_ILS:205621 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Kuna, Meinhard. editor.&#160;Ricoeur, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9887-0">http://dx.doi.org/10.1007/978-90-481-9887-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety of VVER-440 Reactors Barriers Against Fission Products Release ent://SD_ILS/0/SD_ILS:176246 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Sluge&#328;, Vladim&iacute;r. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-420-3">http://dx.doi.org/10.1007/978-1-84996-420-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Towards Estimating Entrainment Fraction for Dust Layers ent://SD_ILS/0/SD_ILS:174242 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Ural, Erdem A. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3372-9">http://dx.doi.org/10.1007/978-1-4614-3372-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Blast Cleaning Technology ent://SD_ILS/0/SD_ILS:186922 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Momber, Andreas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73645-5">http://dx.doi.org/10.1007/978-3-540-73645-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metal Fatigue What It Is, Why It Matters ent://SD_ILS/0/SD_ILS:169533 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Pook, Les. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5597-3">http://dx.doi.org/10.1007/978-1-4020-5597-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultrasonic Nondestructive Evaluation Systems Models and Measurements ent://SD_ILS/0/SD_ILS:166454 2024-09-10T12:31:46Z 2024-09-10T12:31:46Z Author&#160;Schmerr, Lester W. author.&#160;Song, Sung-Jin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49063-2">http://dx.doi.org/10.1007/978-0-387-49063-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>