Search Results for -- Türkiye -- Tarihi. - Narrowed by: Electronic Library - Characterization and Evaluation of Materials. - Nanotechnology. - Physics.
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2024-08-21T23:07:10Z
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
2024-08-21T23:07:10Z
2024-08-21T23:07:10Z
Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333137.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
2024-08-21T23:07:10Z
2024-08-21T23:07:10Z
Author Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
ent://SD_ILS/0/SD_ILS:333081
2024-08-21T23:07:10Z
2024-08-21T23:07:10Z
Author Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333081.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-18018-7">http://dx.doi.org/10.1007/978-3-642-18018-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>