Search Results for -- Türkiye -- Tarihi. - Narrowed by: Electronic Library - Metrology. - Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bT$0025C3$0025BCrkiye$002b--$002bTarihi.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Metrology.$002509Metrology.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
2024-08-21T19:14:39Z
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:424285
2024-08-21T19:14:39Z
2024-08-21T19:14:39Z
Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2024-08-21T19:14:39Z
2024-08-21T19:14:39Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2024-08-21T19:14:39Z
2024-08-21T19:14:39Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>