Search Results for -- T&uuml;rkiye -- Tarihi. - Narrowed by: Electronic Library - Nanotechnology. - System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bT$0025C3$0025BCrkiye$002b--$002bTarihi.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-08-21T22:46:30Z Nanomaterials: A Danger or a Promise? A Chemical and Biological Perspective ent://SD_ILS/0/SD_ILS:330931 2024-08-21T22:46:30Z 2024-08-21T22:46:30Z Author&#160;Brayner, Roberta. editor.&#160;Fi&eacute;vet, Fernand. editor.&#160;Coradin, Thibaud. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330931.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4213-3">http://dx.doi.org/10.1007/978-1-4471-4213-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk Management and Governance Concepts, Guidelines and Applications ent://SD_ILS/0/SD_ILS:192493 2024-08-21T22:46:30Z 2024-08-21T22:46:30Z Author&#160;Aven, Terje. author.&#160;Renn, Ortwin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-13926-0">http://dx.doi.org/10.1007/978-3-642-13926-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:170410 2024-08-21T22:46:30Z 2024-08-21T22:46:30Z Author&#160;Merkus, Henk G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-08-21T22:46:30Z 2024-08-21T22:46:30Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Force Sensors for Microelectronic Packaging Applications ent://SD_ILS/0/SD_ILS:181096 2024-08-21T22:46:30Z 2024-08-21T22:46:30Z Author&#160;Schwizer, J&uuml;rg. author.&#160;Mayer, Michael. author.&#160;Brand, Oliver. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>