Search Results for -- Türkiye -- Tarihi. - Narrowed by: Electronic Library - Nanotechnology. - Weights and measures.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003d--$002bT$0025C3$0025BCrkiye$002b--$002bTarihi.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
2024-08-21T22:05:10Z
Particle Size Measurements Fundamentals, Practice, Quality
ent://SD_ILS/0/SD_ILS:170410
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Merkus, Henk G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Vacuum Technology Practice for Scientific Instruments
ent://SD_ILS/0/SD_ILS:187153
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Yoshimura, Nagamitsu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74433-7">http://dx.doi.org/10.1007/978-3-540-74433-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscale Devices - Fundamentals and Applications
ent://SD_ILS/0/SD_ILS:169377
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Gross, Rudolf. editor. Sidorenko, Anatolie. editor. Tagirov, Lenar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-5107-4">http://dx.doi.org/10.1007/978-1-4020-5107-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
ent://SD_ILS/0/SD_ILS:169412
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5258-8">http://dx.doi.org/10.1007/1-4020-5258-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Microscale Diagnostic Techniques
ent://SD_ILS/0/SD_ILS:180737
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Breuer, Kenneth S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Integrated Chemical Microsensor Systems in CMOS Technology
ent://SD_ILS/0/SD_ILS:181372
2024-08-21T22:05:10Z
2024-08-21T22:05:10Z
Author Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>