Search Results for -- UYGARLIK, ORTAÇAĞ, EDEBİYATTA. - Narrowed by: Logic design. - Performance and Reliability.
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2024-08-11T23:55:45Z
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
2024-08-11T23:55:45Z
2024-08-11T23:55:45Z
Author Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335669.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Engineering and Technology 16th National Conference, NCCET 2012, Shanghai, China, August 17-19, 2012, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334080
2024-08-11T23:55:45Z
2024-08-11T23:55:45Z
Author Xu, Weixia. editor. Xiao, Liquan. editor. Lu, Pingjing. editor. Li, Jinwen. editor. Zhang, Chengyi. editor.<br/>Preferred Shelf Number ONLINE(334080.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-35898-2">http://dx.doi.org/10.1007/978-3-642-35898-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Engineering and Technology 17th CCF Conference, NCCET 2013, Xining, China, July 20-22, 2013. Revised Selected Papers
ent://SD_ILS/0/SD_ILS:335131
2024-08-11T23:55:45Z
2024-08-11T23:55:45Z
Author Xu, Weixia. editor. Xiao, Liquan. editor. Zhang, Chengyi. editor. Li, Jinwen. editor. Yu, Liyan. editor.<br/>Preferred Shelf Number ONLINE(335131.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-41635-4">http://dx.doi.org/10.1007/978-3-642-41635-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>