Search Results for Abran, Alain. - Narrowed by: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAbran$00252C$002bAlain.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300? 2024-12-14T03:24:48Z Software metrics and software metrology ent://SD_ILS/0/SD_ILS:249319 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Abran, Alain, 1949-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings ent://SD_ILS/0/SD_ILS:191262 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Abran, Alain. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Cuadrado-Gallego, Juan J. editor.&#160;Brunekreef, Jacob. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05415-0">http://dx.doi.org/10.1007/978-3-642-05415-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> COSMIC function points theory and advanced practices ent://SD_ILS/0/SD_ILS:288876 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Dumke, Reiner.&#160;Abran, Alain, 1949-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439844878">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software maintenance management evaluation and continuous improvement ent://SD_ILS/0/SD_ILS:249324 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;April, Alain, 1958-&#160;Abran, Alain, 1949-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129685">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129685</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Engineering Research, Management and Applications 2010 ent://SD_ILS/0/SD_ILS:192281 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Lee, Roger. editor.&#160;Ormandjieva, Olga. editor.&#160;Abran, Alain. editor.&#160;Constantinides, Constantinos. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-13273-5">http://dx.doi.org/10.1007/978-3-642-13273-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers ent://SD_ILS/0/SD_ILS:188722 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Cuadrado-Gallego, Juan J. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Abran, Alain. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85553-8">http://dx.doi.org/10.1007/978-3-540-85553-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings ent://SD_ILS/0/SD_ILS:189262 2024-12-14T03:24:48Z 2024-12-14T03:24:48Z Author&#160;Dumke, Reiner R. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;B&uuml;ren, G&uuml;nter. editor.&#160;Abran, Alain. editor.&#160;Cuadrado-Gallego, Juan J. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-89403-2">http://dx.doi.org/10.1007/978-3-540-89403-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>