Search Results for Accelerated life testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAccelerated$002blife$002btesting.$0026ps$003d300?dt=list2026-03-20T19:06:05ZAccelerated life testing of one-shot devices : data collection and analysisent://SD_ILS/0/SD_ILS:5963402026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.<br/>Preferred Shelf Number TA169.3 .B35 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>14th International Conference on Asphalt Pavements ISAP2024 Montrealent://SD_ILS/0/SD_ILS:6066332026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Carter, Alan. editor. Vasconcelos, Kamilla. editor. Dave, Eshan. editor. (orcid)0000-0001-9788-2246 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-67252-1">https://doi.org/10.1007/978-3-031-67252-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Prediction Technologies for Improving Engineering Product Efficiencyent://SD_ILS/0/SD_ILS:5270292026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Klyatis, Lev M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-16655-6">https://doi.org/10.1007/978-3-031-16655-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design of Mechanical Systems Accelerated Lifecycle Testing and Reliabilityent://SD_ILS/0/SD_ILS:5268292026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Woo, Seongwoo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Photovoltaic module reliabilityent://SD_ILS/0/SD_ILS:5957392026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineering and servicesent://SD_ILS/0/SD_ILS:5946572026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Jin, Tongdan, author.<br/>Preferred Shelf Number TS173 .J56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability prediction and testing textbookent://SD_ILS/0/SD_ILS:5942092026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Klyatis, Lev M., author. Anderson, Edward, 1945- author.<br/>Preferred Shelf Number TA169.3 .K5964 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:5937282026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Service Life Prediction of Exterior Plastics Vision for the Futureent://SD_ILS/0/SD_ILS:5292402026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor White, Christopher C. editor. Martin, Jon. editor. Chapin, J. Thomas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06034-7">https://doi.org/10.1007/978-3-319-06034-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systemsent://SD_ILS/0/SD_ILS:5292772026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Green building, materials and civil engineering : proceedings of the 4th International Conference on Green Building, Materials and Civil Engineering (GBMCE 2014), Hong Kong, 21-22 August 2014ent://SD_ILS/0/SD_ILS:5433622026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor International Conference on Green Building, Materials and Civil Engineering (GBMCE) (4th : 2014 : Hong Kong). Author. Kao, Jimmy C. M. (Jimmy Chih-Ming), 1963- editor. Sung, Wen-Pei, editor. Chen, Ran, Dr., editor.<br/>Preferred Shelf Number TH880 .I58 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315751986">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in pavement design through full-scale accelerated pavement testing : proceedings of the 4th International Conference on Accelerated Pavement Testing, Davis, CA, USA, 19-21 September 2012ent://SD_ILS/0/SD_ILS:5423092026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor International Conference on Accelerated Pavement Testing (4th : 2012 : Davis, Calif.) Jones, David.<br/>Preferred Shelf Number TE250 .I58 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135101800">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>The Weibull distribution : a handbookent://SD_ILS/0/SD_ILS:5450272026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Rinne, Horst., author.<br/>Preferred Shelf Number QA273.6 .R56 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420087444">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Coatings technology : fundamentals, testing, and processing techniquesent://SD_ILS/0/SD_ILS:5470362026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Tracton, Arthur A.<br/>Preferred Shelf Number TP156 .C57 C616 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420044089">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:2544152026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:5442082026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number TA174 .E544 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated life models : modeling and statistical analysisent://SD_ILS/0/SD_ILS:5438282026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Bagdonavicius, V. (Vilijandas), author. Nikulin, M. S. (Mikhail Stepanovich)<br/>Preferred Shelf Number TA169.3 .N55 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420035872">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>High Voltage Engineering and Testingent://SD_ILS/0/SD_ILS:2478962026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Ryan, Hugh M., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBPO032E">http://dx.doi.org/10.1049/PBPO032E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592026-03-20T19:06:05Z2026-03-20T19:06:05ZAuthor Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
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